Dual-Beam FIB/SEM: CrossBeam 350

Overview

The CrossBeam 350 from ZEISS is a dual-beam FIB/SEM platform designed for multidisciplinary use in life sciences and materials science. It supports cryogenic workflows, enabling the analysis of biological samples prepared by cryomethods such as plunge freezing, high-pressure freezing and freeze substitution, while preserving ultrastructural integrity. The system also enables integrated correlative workflows with confocal and cryo-confocal microscopy, and supports 3D structural and compositional analysis through serial sectioning and EDS-based characterization.

Research Applications

The CrossBeam 350 is suitable for high-resolution imaging and correlative microscopy across a wide range of samples. It can be used for simultaneous electron and ion beam observation, site-specific sample preparation for downstream TEM analysis, 2D and 3D compositional characterization, serial nanotomography, microstructure analysis, and FIB-based modification or fabrication of structures. It is particularly valuable for cryogenic correlative workflows and volume electron microscopy in biological research.

Technical Specifications

-GEMINI electron column

-Ga ion column, operating at different voltage ranges

-Secondary electron detectors, including Everhart-Thornley and in-lens detection

-Backscattered electron detectors, including retractable annular and in-lens detectors

-Oxford Instruments X100 EDS detector with a minimum detection area of 100 mm²

-Two CCD cameras inside the chamber

-Two gas injection systems, using tungsten and carbon

-Kleindiek Nanotechnik MM3A-EM micromanipulator with x, y, z and rotational movement, operable at room temperature and liquid nitrogen temperature

-Quorum PP3010Z cryo-preparation chamber with cryo-fracture capability

-Dedicated sample holder enabling transfer from confocal microscopy to FIB-SEM for correlative observation at room or cryogenic temperature